Atomic Force Microscopy in Controlled Glove Box Environment
For some materials, AFM measurements in controlled environments are required or preferable. This is particularly important if a material strongly reacts or deteriorates in air or if the measurements are impacted by the presence of water and oxygen. CNMS provides an Ar filled glove box equipped with a Bruker Dimension Icon AFM. The large sample stage can be moved linearly in x- and y- directions, which makes it suitable for larger samples. A range of AFM modes for functional material characterization are available.
Features:
Available modes:
- Contact
- Tapping
- Fast Force Volume
- Peak Force Tapping
- Peak Force Quantitative Nanomechanics
- Conductive AFM
- Electric Force Microscopy
- Kelvin Probe Microscopy
- Piezoresponse Force Microscopy
- Custom Band Excitation PFM modes through
Specifications:
- Sample size 12x12 mm
- Scan range (80x80 um)
- Z height limit (<10 繕m)
- Environmental Control
- Glove box (Ar filled)
- Temperature stage (sample heating 0-250 C)
Applications:
2-dimensional materials
Thin films
Ferroelectrics
Semiconductors
Polymers
Equipment:
Bruker Dimension Icon AFM
Contacts
Nanoscale electric and dielectric characterization
Nanoelectromechanics