The Scienta Omicron VT SPM is the most reliable SPM for room- and variable temperature applications. The classic Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example, high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available.
Features:
Available modes:
- Band excitation piezoresponse force microscopy
- Kelvin probe force microscopy
- Magnetic force microscopy
- Electrostatic force microscopy
Specifications/Extras:
- Temperature: 77K – 500K, pressure: 10E-10 Torr (UHV)
- Nanonis controller
- Preparation chamber: plasma and sputter clean, anneal
- Residual gas analyzer
Equipment:
Scienta Omicron VT SPM with Nanonis Electronics
References:
Dziaugys, A., Kelley, K., Brehm, J.A. et al. Piezoelectric domain walls in van der Waals antiferroelectric CuInP2Se6. Nat Commun 11, 3623 (2020).
Contacts
Functional studies
Thermal dependence of functional studies in vacuum
Variable temperature SPM