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Automated Cryo-TEM of Highly Beam-Sensitive Hard-Soft Ionomer Interfaces in Green Hydrogen Devices

by Michael J Zachman, Bingzhang Zhang, Gang Wu, David A Cullen
Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1749 to 1750
Volume
30
Issue
Supplement
Conference Name
Microscopy & Microanalysis 2024
Conference Location
Cleveland, Ohio, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-