Insights into secondary ion formation during dynamic SIMS analysis: Evidence from sputtering of laboratory synthesized uranium compounds with a high-energy O− primary beam on a NanoSIMS 50L

Publication

Publication Type

Journal

Journal Name

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Publication Date

September, 2021

Page Numbers

164 to 175

Volume

502

Issue

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