Abstract
This work focuses on the use of x-ray computed tomography for non-destructive characterization of additively manufactured parts. Ti-6Al-4V parts manufactured using electron beam melting were used. Within this context a comparative study between laboratory and synchrotron-based x-ray computed tomography (LXCT and SXCT) is presented showing the advantages of both techniques. Additionally, the interplay between field-of-view, resolution and sub-sample extraction is systematically presented both qualitatively and quantitatively for LXCT. Overall, it was concluded that laboratory based 弮XCT offered a compelling alternative to SXCT for static measurements involving defect characterization in AM parts while synchrotron-based techniques offered unmatched performance for dynamic and sub-micron studies.
