Ben C Larson Corporate Fellow (Emeritus) Contact LARSONBC@ORNL.GOV All Publications X-RAY DIFFUSE SCATTERING NEAR BRAGG REFLECTIONS FOR THE STUDY OF CLUSTERED DEFECTS IN CRYSTALLINE MATERIALS... On the Elastic Boundary Value Problem of Dislocations in Bounded Crystals Polychromatic X-ray Micro- and Nanodiffraction for Spatially-Resolved Structural Studies Dislocation Density Tensor Characterization of Deformation Using 3D X-Ray Microscopy... Non-Resonant Inelastic X-Ray Scattering and Energy-Resolved Wannier Function Investigation of d-d Excitations in NiO and CoO Polychromatic X-ray Micro- and Nano-Beam Science and Instrumentation Experimental Characterization of The Mesoscale Dislocation Density Tensor ... High-performance Kirkpatrick-Baez Supermirrors for Neutron Milli- and Micro-beams Depth-resolved residual strain in MoN/Mo nanocrystalline films Thermal and Electromigration-Induced Strains in Polycrystalline Films and Conductor Lines: X-Ray Microbeam Measurements and A... X-Ray Microbeam Measurements of Individual Dislocation Cell Elastic Strains in Deformed Single-Crystal Copper... X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper... Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures... Nonequilibrium Interlayer Transport in Pulsed Laser Deposition Electron-Hole Excitations in NiO: LSDA + U-Based Calculations vs. Inelastic X-Ray Scattering and Ellipsometry Measurements Electron-Hole and Plasmon Excitations in 3<italic>d<italic> Transition Metals: <italicAb initio</italic> Calculations and Ine... Lattice rotation patterns and strain gradient effects in face-centered-cubic single crystals under spherical indentation X-ray Microbeam Measurements of Subgrain Stress Distributions in Polycrystalline Materials... Nondestructive Three-Dimensional Characterization of Grain Boundaries by X-Ray Crystal Microscopy... Polychromatic X-Ray Microdiffraction Studies of Mesoscale Structure and Dynamics... X-ray Microbeam Diffraction Measurements in Polycrystalline Aluminum and Copper Thin Films... Large Crystal Local-Field Effects in the Dynamical Structure Factor of Rutile TiO<sub>2</sub> Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum Pagination First page « First Previous page ‹â¶Ä¹ Page 1 Current page 2 Organizations Physical Sciences Directorate Materials Science and Technology Division Foundational Materials Science Section Neutron and X-Ray Scattering Group
