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ORNL researchers have developed a deep learning-based approach to rapidly perform high-quality reconstructions from sparse X-ray computed tomography measurements.
We have been working to adapt background oriented schlieren (BOS) imaging to directly visualize building leakage, which is fast and easy.
Simurgh revolutionizes industrial CT imaging with AI, enhancing speed and accuracy in nondestructive testing for complex parts, reducing costs.
This innovative approach combines optical and spectral imaging data via machine learning to accurately predict cancer labels directly from tissue images.