
Bio
Anton V. Ievlev is currently R&D Staff Scientist in the Functional Atomic Force Microscopy Group at the Center for Nanophase Materials Sciences (CNMS), a Department of Energy Nanoscale Science Research Center. His research interests are focused on application of diversity of nanoscale characterization techniques, including Atomic Force Microscopy (AFM), Mass Spectrometry and Optical Spectroscopy for correlated characterization of materials. His research is complemented by data analytics techniques for automated interpretation of multidimensional and "Big data."
Education
- Ural State University, Ekaterinburg, Russia, Physics, B.S., 2007
- Ural State University, Ekaterinburg, Russia, Physics, M.S., 2009
- Ural Federal University, Ekaterinburg, Russia, Physics, PhD, 2012
Professional Experience
- 2018 - p R&D Staff Scientist; Center for Nanophase Materials Science, 91°µÍø
- 2013 - 2017 Postdoctoral Research Associate; Scanning Probe Microscopy Group, Center for Nanophase Materials Science, 91°µÍø
- 2012 – 2013 Researcher, Institute of Natural Sciences, Ural Federal University, Ekaterinburg, Russia
- 2006 – 2012 Junior Researcher, Institute of Physics and Applied Mathematics, Ural State University, Ekaterinburg, Russia
Publications
July 2015
Journal: Applied Physics Letters
June 2015
Journal: Physical Review B
June 2015
Journal: Nanoscale
May 2015
Journal: Applied Physics Letters
January 2015
Symmetry breaking and electrical frustration during tip-induced polarization switching in the non…
Journal: ACS Nano