1 - 9 of 9 Results
The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.
Fusion reactors need efficient systems to create tritium fuel and handle intense heat and radiation. Traditional liquid metal systems face challenges like high pressure losses and material breakdown in strong magnetic fields.
The traditional window installation process involves many steps. These are becoming even more complex with newer construction requirements such as installation of windows over exterior continuous insulation walls.
This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.
The interface gasket for building envelope is designed to enhance the installation of windows and other objects into building openings.
This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.
The need for accurate temperature measurement in critical environments such as nuclear reactors is paramount for safety and efficiency.