1 - 10 of 28 Results
Dual-GP addresses limitations in traditional GPBO-driven autonomous experimentation by incorporating an additional surrogate observer and allowing human oversight, this technique improves optimization efficiency via data quality assessment and adaptability to unanticipated exp
A pressure burst feature has been designed and demonstrated for relieving potentially hazardous excess pressure within irradiation capsules used in the ORNL High Flux Isotope Reactor (HFIR).
The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
Scanning transmission electron microscopes are useful for a variety of applications. Atomic defects in materials are critical for areas such as quantum photonics, magnetic storage, and catalysis.
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.
A human-in-the-loop machine learning (hML) technology potentially enhances experimental workflows by integrating human expertise with AI automation.
This technology is a laser-based heating unit that offers rapid heating profiles on a research scale with minimal incidental heating of materials processing environments.
Red mud residue is an industrial waste product generated during the processing of bauxite ore to extract alumina for the steelmaking industry. Red mud is rich in minerals in bauxite like iron and aluminum oxide, but also heavy metals, including arsenic and mercury.
The scanning transmission electron microscope (STEM) provides unprecedented spatial resolution and is critical for many applications, primarily for imaging matter at the atomic and nanoscales and obtaining spectroscopic information at similar length scales.