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The invention presented here addresses key challenges associated with counterfeit refrigerants by ensuring safety, maintaining system performance, supporting environmental compliance, and mitigating health and legal risks.
The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
Neutron scattering experiments cover a large temperature range in which experimenters want to test their samples.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.
Moisture management accounts for over 40% of the energy used by buildings. As such development of energy efficient and resilient dehumidification technologies are critical to decarbonize the building energy sector.
Knowing the state of charge of lithium-ion batteries, used to power applications from electric vehicles to medical diagnostic equipment, is critical for long-term battery operation.
This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.
This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.
This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.