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Researcher
- Rama K Vasudevan
- Ryan Dehoff
- Sergei V Kalinin
- Yongtao Liu
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- Maxim A Ziatdinov
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- Gyoung Gug Jang
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- Yarom Polsky
- Yukinori Yamamoto
- Zhiming Gao

Dual-GP addresses limitations in traditional GPBO-driven autonomous experimentation by incorporating an additional surrogate observer and allowing human oversight, this technique improves optimization efficiency via data quality assessment and adaptability to unanticipated exp

This technology can help to increase number of application areas of Wireless Power Transfer systems. It can be applied to consumer electronics, defense industry, automotive industry etc.

V-Cr-Ti alloys have been proposed as candidate structural materials in fusion reactor blanket concepts with operation temperatures greater than that for reduced activation ferritic martensitic steels (RAFMs).

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

Faults in the power grid cause many problems that can result in catastrophic failures. Real-time fault detection in the power grid system is crucial to sustain the power systems' reliability, stability, and quality.

With the ever-growing reliance on batteries, the need for the chemicals and materials to produce these batteries is also growing accordingly. One area of critical concern is the need for high quality graphite to ensure adequate energy storage capacity and battery stability.

Test facilities to evaluate materials compatibility in hydrogen are abundant for high pressure and low temperature (<100C).

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

Scanning transmission electron microscopes are useful for a variety of applications. Atomic defects in materials are critical for areas such as quantum photonics, magnetic storage, and catalysis.

Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.