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Researcher
- Kyle Kelley
- Rama K Vasudevan
- Singanallur Venkatakrishnan
- Vincent Paquit
- Amir K Ziabari
- Andrzej Nycz
- Kuntal De
- Philip Bingham
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- Huixin (anna) Jiang
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- Neus Domingo Marimon
- Obaid Rahman
- Olga S Ovchinnikova
- Ondrej Dyck
- Philip Boudreaux
- Saban Hus
- Steven Randolph
- Xiaohan Yang
- Yongtao Liu

ORNL researchers have developed a deep learning-based approach to rapidly perform high-quality reconstructions from sparse X-ray computed tomography measurements.

We have been working to adapt background oriented schlieren (BOS) imaging to directly visualize building leakage, which is fast and easy.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.

We present the design, assembly and demonstration of functionality for a new custom integrated robotics-based automated soil sampling technology as part of a larger vision for future edge computing- and AI- enabled bioenergy field monitoring and management technologies called

Moisture management accounts for over 40% of the energy used by buildings. As such development of energy efficient and resilient dehumidification technologies are critical to decarbonize the building energy sector.

Due to a genes unique nucleotide sequences acquired through horizontal gene transfer, the gene has a transcriptional repressor activity and innate enzymatic role.

This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.