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ORNL has developed a large area thermal neutron detector based on 6LiF/ZnS(Ag) scintillator coupled with wavelength shifting fibers. The detector uses resistive charge divider-based position encoding.
The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.
High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.
High strength, oxidation resistant refractory alloys are difficult to fabricate for commercial use in extreme environments.
This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.
This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.