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Researcher
- Alex Plotkowski
- Amit Shyam
- Kyle Kelley
- Rama K Vasudevan
- James A Haynes
- Sergei V Kalinin
- Stephen Jesse
- Sumit Bahl
- Alice Perrin
- An-Ping Li
- Andres Marquez Rossy
- Andrew Lupini
- Anton Ievlev
- Bogdan Dryzhakov
- Gerry Knapp
- Hoyeon Jeon
- Huixin (anna) Jiang
- Jamieson Brechtl
- Jewook Park
- Jovid Rakhmonov
- Kai Li
- Kashif Nawaz
- Kevin M Roccapriore
- Liam Collins
- Marti Checa Nualart
- Maxim A Ziatdinov
- Neus Domingo Marimon
- Nicholas Richter
- Olga S Ovchinnikova
- Ondrej Dyck
- Peeyush Nandwana
- Ryan Dehoff
- Saban Hus
- Steven Randolph
- Sunyong Kwon
- Ying Yang
- Yongtao Liu

Currently available cast Al alloys are not suitable for various high-performance conductor applications, such as rotor, inverter, windings, busbar, heat exchangers/sinks, etc.

The invented alloys are a new family of Al-Mg alloys. This new family of Al-based alloys demonstrate an excellent ductility (10 ± 2 % elongation) despite the high content of impurities commonly observed in recycled aluminum.

The invention introduces a novel, customizable method to create, manipulate, and erase polar topological structures in ferroelectric materials using atomic force microscopy.

High coercive fields prevalent in wurtzite ferroelectrics present a significant challenge, as they hinder efficient polarization switching, which is essential for microelectronic applications.

Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images.

Moisture management accounts for over 40% of the energy used by buildings. As such development of energy efficient and resilient dehumidification technologies are critical to decarbonize the building energy sector.

This technology provides a device, platform and method of fabrication of new atomically tailored materials. This “synthescope” is a scanning transmission electron microscope (STEM) transformed into an atomic-scale material manipulation platform.

This invention presents technologies for characterizing physical properties of a sample's surface by combining image processing with machine learning techniques.

A diver-operated system brings safe and portable imaging to a new operating environment – underwater at depths up to 300 feet.

This invention introduces a system for microscopy called pan-sharpening, enabling the generation of images with both full-spatial and full-spectral resolution without needing to capture the entire dataset, significantly reducing data acquisition time.